UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
发明人:
KWON Dae Il
申请号：
US201715401097
公开号：
US2017206459(A1)
申请日:
2017.01.09
申请国别(地区):
美国
年份:
2017
代理人:
摘要：
Provided is a failure prediction method using a failure prediction apparatus, including: receiving time-series data about measured performance parameters from a device under test; encoding the time-series data with a plurality of symbols corresponding to a predetermined range; calculating a transition probabilities between the symbols of the encoded time-series data, and generating a transition matrix according to the transition probabilities; calculating an abnormal indicator, which is a difference between the transition matrix and a pre-stored database, and an increased value of the abnormal indicator; and comparing the increased value of the abnormal indicator and a predetermined threshold value, and if the increased value of the abnormal indicator is greater than the predetermined threshold value, predicting that failure of the device under test is to occur.
