A method includes determining, internal to a memory device, a number of program pulses required to program a sample of memory cells of the memory device during a first programming operation, comparing the determined number of program pulses required to program the sample of memory cells of the memory device to a target number of program pulses, and adjusting a program starting voltage level of one or more program pulses applied to one or more memory cells of the sample of memory cells during a second programming operation subsequent to the first programming operation when the determined number of program pulses required to program the sample of memory cells in the first programming operation is different than the target number so that the number of program pulses applied during the second programming operation tends toward the target number.
