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Selectable separate scan paths with hold state multiplexer and adapter
专利权人:
Texas Instruments Incorporated
发明人:
Whetsel Lee D.
申请号:
US201615278733
公开号:
US9709628(B2)
申请日:
2016.09.28
申请国别(地区):
美国
年份:
2017
代理人:
Bassuk Lawrence J.`Brill Charles A.`Cimino Frank D.
摘要:
A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known scan path into scan path 502, to insert scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and scan path 502.
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