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INTERFACE TEST DEVICE
专利权人:
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. ;HON HAI PRECISION INDUSTRY CO., LTD.
发明人:
MA JIN-SHAN,DAI WEN-HAO
申请号:
US201514808674
公开号:
US2016328306(A1)
申请日:
2015.07.24
申请国别(地区):
美国
年份:
2016
代理人:
摘要:
An interface test device includes several interfaces, a test signal input interface, a control signal input interface, and a control module. The interface test device is connected between an electronic device and a computer. The interface test device receives control signals from the computer through the control signal input interface. The interface test device selectively outputs test signals to the electronic device through test interfaces corresponding to the control signals.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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