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X-RAY PHASE DIFFERENCE IMAGING SYSTEM AND PHASE CONTRAST IMAGE CORRECTION METHOD
专利权人:
Shimadzu Corporation
发明人:
Taro SHIRAI,Kenji KIMURA,Takahiro DOKI,Satoshi SANO,Akira HORIBA,Naoki MORIMOTO
申请号:
US16636737
公开号:
US20200196969A1
申请日:
2018.09.18
申请国别(地区):
US
年份:
2020
代理人:
摘要:
This X-ray phase difference imaging system (100) includes an X-ray source (1), a plurality of gratings, a detector (4), and an image processor (6), in which the image processor (6) is configured to correct an artifact of a second phase contrast image (10b) that is reconstructed by using a first X-ray image (9a) and a third X-ray image (9c), on the basis of a first phase contrast image (10a) that is reconstructed by using the first X-ray image (9a) and a second X-ray image (9b).
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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