Response collector circuitry coupled with through silicon via and tap

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专利权人:

Texas Instruments Incorporated

发明人:

Whetsel Lee D.

申请号：

US201514826617

公开号：

US9671426(B2)

申请日:

2015.08.14

申请国别(地区):

美国

年份:

2017

代理人:

Bassuk Lawrence J.`Brill Charles A.`Cimino Frank D.

摘要：

The disclosure describes a novel method and apparatus for improving silicon interposers to include test circuitry for testing stacked die mounted on the interposer. The improvement allows for the stacked die to be selectively tested by an external tester or by the test circuitry included in the interposer.

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