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METHOD FOR PARAMETERIZING A FIELD DEVICE, AND FIELD DEVICE THAT CAN BE PARAMETERIZED
专利权人:
SIEMENS AKTIENGESELLSCHAFT
发明人:
AUGUSTIN, Martin,BORRMANN, Martin,KLOTZBACH, Michael,MILANOVIC, Marco,PRAMANIK, Robin
申请号:
WO2018EP58543
公开号:
WO2018185126(A1)
申请日:
2018.04.04
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
The invention relates to a method for parameterizing a field device (Fx) by means of at least one parameter (SCUP) and to a field device for carrying out the method. For validation, a first checking characteristic (P1) is calculated by the field device (Fx) on the basis of the parameter (SCUP) and a device ID (SN), is stored in a memory (21) of the field device (Fx), and is transferred to an engineering system (4) via a logical interface. In addition, the parameter to be validated and the device ID are transferred to the engineering system (4) via a logical interface that is data-diverse with respect to the aforementioned interface and are output on a display (6) there. In order to confirm correct parameterization, a user can input the read first checking characteristic (P1) at an operating unit (6) of the engineering system (4), which first checking characteristic is then transferred back to the field device (Fx) via the data-diverse interface. The received checking characteristic (P1') is compared with the
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