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MAGNETIC SUSCEPTIBILITY MEASUREMENT DEVICE AND MAGNETIC SUSCEPTIBILITY MEASUREMENT METHOD
专利权人:
KAWANO LAB. INC.;HORIBA, LTD.
发明人:
KAWANO, Makoto,YAMAGUCHI, Tetsuji,NISHIKATA, Kentaro
申请号:
WO2016JP81304
公开号:
WO2017069251(A1)
申请日:
2016.10.21
申请国别(地区):
世界知识产权组织国际局
年份:
2017
代理人:
摘要:
In order to enable magnetic susceptibility to be measured even in a range of particle diameters smaller than by the prior art, and to measure magnetic susceptibility in the same manner also in the particle diameter range of measurement of the prior art, the present invention is provided with a first particle diameter calculation unit for calculating the particle diameter of a particle on the basis of the size of the particle in an image captured by an imaging mechanism, a second particle diameter calculation unit for calculating the particle diameter of the particle by a dynamic light scattering method or a static light scattering method on the basis of the intensity of particle-scattered light indicated by an output signal outputted from a scattered-light detector, and a magnetic susceptibility calculation unit 6 for calculating the magnetic susceptibility of the particle on the basis of a magnetophoresis speed of the particle and the particle diameter of the particle, and the present invention is configured
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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