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Three-dimensional shape measurement device, three-dimensional shape measurement method, and three-dimensional shape measurement program
专利权人:
TOPPAN PRINTING CO., LTD.
发明人:
Unten Hiroki,Ishii Tatsuya
申请号:
US201514886896
公开号:
US9704255(B2)
申请日:
2015.10.19
申请国别(地区):
美国
年份:
2017
代理人:
Oblon, McClelland, Maier & Neustadt, L.L.P.
摘要:
A device for measuring a three-dimensional shape includes an imaging unit which sequentially outputs a first two-dimensional image being captured and outputs a second two-dimensional image according to an output instruction, the second two-dimensional image having a setting different from a setting of the first two-dimensional image, an output instruction generation unit which generates the output instruction based on a shape defect ratio obtained by generating a three-dimensional model based on the second two-dimensional image outputted by the imaging unit and viewing a three-dimensional model from a viewpoint at which the first two-dimensional image is captured, and a storage unit which stores the second two-dimensional image outputted by the imaging unit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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