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X-ray detector apparatus for detecting X-ray radiation at an inclination angle
专利权人:
コーニンクレッカ フィリップス エヌ ヴェ
发明人:
ロースル エワルド,コエラー トーマス
申请号:
JP2017514342
公开号:
JP6262919B2
申请日:
2015.12.01
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
The invention relates to an X-ray detector device (10) for detection of X-ray radiation at an inclined angle relative to the X-ray radiation, an X-ray imaging system (1), an X-ray imaging method, and a computer program element for controlling such device or system for performing such method and a computer readable medium having stored such computer program element. The X-ray detector device (10) comprises a cathode surface (11) and an anode surface (12). The cathode surface (11) and the anode surface (12) are displaced by a separation layer (13) allowing charge transport (T) between the cathode surface (11) and the anode surface (12) in response to X-ray radiation incident during operation on the cathode surface (11). The anode surface (12) is segmented into anode pixels (121) and the cathode surface (11) is segmented into cathode pixels (111). At least one of the cathode pixels (111) is assigned to at least one of the anode pixels (121) in a coupling direction (C) inclined relative to the cathode surface (11). At least one of the cathode pixels (111) is configured to be at a voltage offset relative to an adjacent cathode pixel and at least one of the anode pixels (121) is configured to be at a voltage offset relative to an adjacent anode pixel (121). The voltage offset is configured to converge the charge transport (T) in a direction parallel to the coupling direction (C).
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