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MAGNETIC SUSCEPTIBILITY MEASURING DEVICE
专利权人:
JEOL LTD
发明人:
SUEMATSU HIROTO,KURIHARA NORIAKI
申请号:
JP20000376871
公开号:
JP2002181748(A)
申请日:
2000.12.12
申请国别(地区):
日本
年份:
2002
代理人:
摘要:
PROBLEM TO BE SOLVED: To substantially improve detection sensitivity without the need for using dynamic displacements of a detector. SOLUTION: In this magnetic susceptibility measuring device for measuring the magnetic susceptibility of a sample through the use of magnetic resonance phenomena, distortion of a magnetic field is measured from magnetic resonance signals when an object to be measured 2 is arranged and not arranged in the vicinity of magnetic resonant matter 2, and the magnetic susceptibility is obtained from the distortion of the magnetic field and the shape of the object to be measured 2.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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