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Integrated test element
专利权人:
Joachim Hoenes
发明人:
Joachim Hoenes,Karl Miltner
申请号:
US10559547
公开号:
US09757059B2
申请日:
2004.06.02
申请国别(地区):
US
年份:
2017
代理人:
摘要:
The invention relates to the field of integrated systems which comprise a test element and a lancet which can be firstly used to make a wound in a skin opening in order to collect a sample. The sample is subsequently directly taken up by the test element in the process of which it comes into contact with a reagent contained in the test element and results in an optically detectable change in a test field. The change in the test field is detected by means of an analytical unit which is optically contacted with the test field via at least one light-conducting element.
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中国工程科技知识中心
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