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ELECTRON MICROSCOPE AND METHOD FOR TRANSMISSION ELECTRON MICROSCOPY IMAGING OF SAMPLE ARRAYS
专利权人:
Scienion AG
发明人:
DUFRESNE, Claude,EICKHOFF, Holger
申请号:
EP20140739691
公开号:
EP3169986(A1)
申请日:
2014.07.17
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要:
A method of electron microscopy imaging of samples, using an electron microscope (100) having a microscope column (10) and a transfer device (11) with a grid carriage (12), comprises the steps of preparing multiple samples (1) on a single electron microscopy grid (2), including dispensing the samples (1) with a dispenser device (30) on distinct positions on the grid (2), introducing the grid (1) with the transfer device (11) into the microscope column (10), and electron microscopy imaging of the samples (1), wherein the preparing step includes holding the grid (2) on the grid carriage (12) of the transfer device (11) or on a grid holder device (20) provided at the electron microscope (100) and dispensing the samples (1) on the grid (2) while holding it on the grid carriage (12) or on the grid holder device (20). Furthermore, an electron microscope (100) for electron microscopy imaging of samples is described.
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中国工程科技知识中心
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