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Charged particle beam irradiation apparatus
专利权人:
发明人:
Masanori Tachibana
申请号:
US15085771
公开号:
US09566453B2
申请日:
2016.03.30
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A charged particle beam irradiation apparatus includes: an accelerator which accelerates charged particles and emits a charged particle beam an irradiation unit which irradiates an irradiation target with the charged particle beam a transport line which transports the charged particle beam emitted from the accelerator, to the irradiation unit an energy adjustment unit which is provided at the transport line and adjusts energy of the charged particle beam a plurality of electromagnets provided further toward the downstream side than the energy adjustment unit in the transport line an electromagnet power source provided to correspond to each of the electromagnets and a control unit which controls a parameter of the electromagnet according to the energy of the charged particle beam, wherein the electromagnet power source has a storage unit which stores the parameter of the electromagnet for each layer which is irradiated with the charged particle beam, in the irradiation target.
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