METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRAPHY X-RAY MICROSCOPY SYSTEM

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专利权人:

Carl Zeiss X-ray Microscopy, Inc.

发明人:

Huang Zhifeng,Case Thomas A.,Steger Lourens B.

申请号：

US201715465937

公开号：

US2017276620(A1)

申请日:

2017.03.22

申请国别(地区):

美国

年份:

2017

代理人:

摘要：

A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/