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TWO-DIMENSIONAL NEAR-FIELD SPECTRAL MICROSCOPE
专利权人:
NATIONAL INSTITUTE FOR MATERIALS SCIENCE
发明人:
NESHIRO HITOSHI
申请号:
JP20130076039
公开号:
JP2014202784(A)
申请日:
2013.04.01
申请国别(地区):
日本
年份:
2014
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a two-dimensional near-field spectral microscope that provides a bright observation image and enables observation of an object at high spatial resolution. ! SOLUTION: A two-dimensional near-field spectral microscope comprises: a hole array 13 attached to the leading end of an objective lens 14; an incident optical system having an imaging lens 16 that magnifies and images an observation light of the objective lens 14; and a bundle type optical fiber cable 30 connecting an incident optical system and a spectroscope 40. The end face of the bundle type optical fiber cable 30 is two-dimensionally arranged on the optical fiber cable end face 32 on the incident optical system side. An optical fiber cable end face 34 on the spectroscope 40 side is arranged one-dimensionally. The hole array 13 has two-dimensionally arranged fine holes. The two-dimensional arrangement of the fine holes corresponds to the two-dimensional arrangement of the optical fiber cable end face 32. ! COPYRIGH
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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