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MEASUREMENT SYSTEM AND METHOD FOR MEASURING MULTI-DIMENSIONS
专利权人:
Industrial Technology Research Institute
发明人:
LAI Yueh-Yi,TSENG Kun-Lung,JHANG Zih-Jian
申请号:
US201615353704
公开号:
US2018075618(A1)
申请日:
2016.11.16
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
Measurement system and method for measuring multi-dimensions of an object are provided. A two-dimensional (2D) image capturing device captures at least one macro-2D image of the object. A three-dimensional (3D) information acquisition device acquires micro-3D measured data of the object. A integration and estimation device performs 2D and 3D image correction on macro-2D image and micro-3D measured data to map micro-3D measured data into macro-2D image to output 3D-topography data corresponding to macro-2D image of the object, and based on machine learning mechanism, performs matching procedure on at least one connection feature between any two positions in 3D-topography data with a database to elect an adapted model. Based on its corresponding to at least one fitting function, the integration and estimation device estimates the connection features of 3D-topography data to output at least one estimated feature amount, thereby obtaining measurement results corresponding to the object.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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