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荷電粒子線照射装置
专利权人:
株式会社東芝
发明人:
菊 地 淳 史,前 田 和 孝,金 井 芳 治,永 渕 照 康
申请号:
JP2009166480
公开号:
JP5321826B2
申请日:
2009.07.15
申请国别(地区):
JP
年份:
2013
代理人:
摘要:

To provide a charged particle beam irradiation device, capable of reducing dispersion of irradiated beam particles and achieving excellent vacuum atmosphere retaining performance.

SOLUTION: The charged particle beam irradiation device includes a beam takeout window 14 composed in double structure comprising a particle beam permeable membrane 101, a connecting duct 104, and a particle beam permeable membrane 102. Dispersion of irradiated beam particles is thus reduced and vacuum atmosphere retaining performance in the charged particle beam irradiation device is improved.

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