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Specimen processing device, specimen conveyance device, and specimen conveyance method
专利权人:
SYSMEX CORPORATION
发明人:
Tanaka, Hiroyuki
申请号:
EP20090012569
公开号:
EP2172781(A3)
申请日:
2009.10.05
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要:
A specimen processing device comprising: a specimen processing unit for processing specimens; a first conveyance mechanism for conveying specimens from a carry-in side towards a carry-out side on the opposite side of the carry-in side with respect to the specimen processing unit through a specimen supply position for supplying specimens to the specimen processing unit; a second conveyance mechanism for conveying specimens from the carry-in side towards the carry-out side without passing the specimen supply position; a first control device for controlling the first conveyance mechanism; and a second control device for controlling the second conveyance mechanism, is disclosed. A specimen conveyance device and a specimen conveyance method are also disclosed.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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