Polarimetric characterization device (100, Displaced200) of a sample (S) comprising: - a Emission Source (10) and at least a light wave incident in at least a First Wavelength (\u03bbe) - a single-mode Optical Fiber (30), in whichThe Incident light wave is intended to spread a polarization State Generator (20) disposed at the proximal side of the Optical Fiber allows the generation of a given number ofStates of polarization of the incident light wave, called States Of Wave a reflector (40,44) to be prepared by the distal side of the Optical Fiber a polarization State Analyzer (50) with the proximal side of the optical fibre allowsFor each State of the probe of the incident Wave, the analysis of the polarization of the light wave is obtained after the Propagation of the incident Wave On The Optical Fiber (30),The Reflection of the distal side of the optical fiber and the reverse propagation in Optical Fiber (30) - methods of treatment (70) to determine: - from a First characterization polarim\u00e9Computing the optical fibre, which is obtained by the analysis for each State of the probe.The polarization of at least one reflected wave on the distal side of the Optical Fiber through the reflector and propagated in the opposite direction in the Optical Fiber (30),A Mueller Matrix (MF (\u03bbe) associated with the first Optical Fiber Wavelength - from a Second Set of polarimetric characterization that includes Fiber Optics and muesTra, obtained by the analysis for each State of the probe polarizationA Wave returned by the distal side of the Fiber in the sample and propagated in the opposite direction in the Optical Fiber (30),A Mueller Matrix (MT) associated to the set in the first Wave length - from the Mueller matrices Associated respectively to the optical fibre and the Assembly comprising the fThe Optics and sample, the Mueller Matrix (MO) associated to the sample in the first wavelength.Dispositivo de caracterización polarimétrica desplazada (100, 200) de una muestr
