Method for out-of-plane deformation or vibration analysis measurement using electronic speckle pattern interferometry based on use of microstructured refracting optical elements

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专利权人:

FACHHOCHSCHULE ULM

发明人:

LAU, BERNHARD,PETROV, VALERY

申请号：

DE19981059781

公开号：

DE19859781(A1)

申请日:

1998.12.23

申请国别(地区):

德国

年份:

2000

代理人:

摘要：

With the method object wave and reference waves are generated by the same Laser source. At least one is at an angle to the optical axis of the camera objective and would be outside its field of view if not redirected by the refracting element

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