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SURFACE PROPERTY MEASUREMENT METHOD, SURFACE PROPERTY MEASUREMENT APPARATUS, AND RECORDING MEDIUM
专利权人:
发明人:
Yuki OGURA,Naohiro HOZUMI,Sachiko YOSHIDA,Kazuto KOBAYASHI,Yusuke HARA
申请号:
US15763301
公开号:
US20190059857A1
申请日:
2016.13.09
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A surface property measurement technology by which a surface property of a substance can be evaluated with high accuracy, is provided.A surface property measurement method includes radiating an ultrasonic wave to a measurement target and acquiring a reflected signal from the measurement target calculating, by a measurement apparatus, a maximum value of a cross-correlation function between the reflected signal from the measurement target and a reference reflected signal from a reference substance acquired in advance calculating a reflection component at an interface, by using the maximum value of the cross-correlation function and outputting, as a measurement value, one of an acoustic impedance of the measurement target or an acoustic impedance of the reference substance, according to a result of comparing the reflection component with the reference reflected signal.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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