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Sensitivity correction method for dose monitoring device and particle beam therapy system
专利权人:
Toshihiro Otani
发明人:
Toshihiro Otani,Hisashi Harada,Masahiro Ikeda,Kazushi Hanakawa,Taizo Honda
申请号:
US13262866
公开号:
US08854048B2
申请日:
2011.03.10
申请国别(地区):
US
年份:
2014
代理人:
摘要:
In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device for measuring a dose of the particle beam and an ionization chamber smaller than the dose monitoring device, the ionization chamber measuring a dose of a particle beam passing through the dose monitoring device, the dose of the particle beam irradiated by the dose monitoring device is measured the dose of the particle beam passing through the dose monitoring device is measured by the small ionization chamber and a correction coefficient of the dose measured by the dose monitoring device corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber.
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