您的位置: 首页 > 农业专利 > 详情页

Sensitivity correction method for dose monitoring device and particle beam therapy system
专利权人:
MITSUBISHI ELECTRIC CORPORATION
发明人:
OTANI, TOSHIHIRO,HARADA, HISASHI,IKEDA, MASAHIRO,HANAKAWA, KAZUSHI,HONDA, TAIZO
申请号:
TW100137488
公开号:
TW201236710A
申请日:
2011.10.17
申请国别(地区):
TW
年份:
2012
代理人:
摘要:
In a particle beam therapy system which scans a particle beam and irradiates the particle beam to an irradiation position of an irradiation subject and has a dose monitoring device (26) for measuring a dose of the particle beam and an ionization chamber (38) smaller than the dose monitoring device (26), the ionization chamber (38) measuring a dose of a particle beam passing through the dose monitoring device (26), the dose of the particle beam irradiated by the dose monitoring device (26) is measured the dose of the particle beam passing through the dose monitoring device (26) is measured by the small ionization chamber (38) and a correction coefficient of the dose measured by the dose monitoring device (26) corresponding to the irradiation position is found based on the dose of the particle beam measured by the small ionization chamber (38).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充