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Integrated system and method for transversal enhanced Raman Spectroscopy
专利权人:
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
发明人:
WANG SHIH-YUAN
申请号:
US20050044781
公开号:
US7136160(B2)
申请日:
2005.01.27
申请国别(地区):
美国
年份:
2006
代理人:
摘要:
Devices and methods for enhancing Raman Spectroscopy are disclosed. A molecular analysis device for performing Raman spectroscopy comprises a substrate and a laser source disposed on the substrate. The laser source is configured for generating a laser radiation with a direction substantially parallel with the substrate. The molecular analysis device also includes a Raman enhancement structure, which may be disposed on the substrate or on a waveguide disposed on the substrate. The Raman enhancement structure has an active surface substantially parallel to the substrate and is configured for producing a Raman scattered radiation. The Raman scattered radiation may be produced, when the laser radiation irradiates an analyte disposed on the Raman enhancement structure, or when an evanescent field emanating from the waveguide irradiates an analyte disposed on the Raman enhancement structure. In addition, a radiation receiver disposed on the substrate is configured for receiving the Raman scattered radiation.
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