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SPECIMEN SHAPE MEASUREMENT METHOD AND SPECIMEN SHAPE MEASUREMENT DEVICE
专利权人:
OLYMPUS CORPORATION
发明人:
SUZUKI Yoshimasa,ODE Hisashi
申请号:
WO2015JP64446
公开号:
WO2016185581(A1)
申请日:
2015.05.20
申请国别(地区):
世界知识产权组织国际局
年份:
2016
代理人:
摘要:
This specimen shape measurement method involves a step S10 for preparing an illumination light which passes through a prescribed illumination region, a step S20 for irradiating a specimen with the illumination light, and a prescribed treatment step S30. The prescribed illumination region is configured such that the optical axis is not contained in the pupil position of an illumination optical system, and is configured such that, in the pupil position of the observation optical system, the illumination light is illuminated onto a portion inside of the pupil and to outside of the pupil. The prescribed treatment step S30 includes a step S31 for receiving light emitted from the observation optical system, a step S32 for calculating the intensity of the received light, a step S33 for calculating the difference between, or the ratio of, the light intensity and a reference light intensity, and a step S34 for calculating the inclination amount of the specimen surface.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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