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IMAGE INSPECTION DEVICE, IMAGE INSPECTION METHOD, AND IMAGE INSPECTION DEVICE COMPONENT
专利权人:
QD LASER, INC.
发明人:
MORINO, Seiji,SUZUKI, Makoto,ISHIMOTO, Manabu
申请号:
WO2017JP28558
公开号:
WO2018034181(A1)
申请日:
2017.08.07
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
An image inspection device provided with: a mounting unit 10 having mounted thereon an image projection device 30 for directly projecting an image onto a user's retina; a condensing lens 12 for condensing a light beam 50 output from the image projection device 30 mounted on the mounting unit 10; a part 14 on which an image is to be projected, the part 14 being irradiated with the light beam condensed by the condensing lens 12 such that an inspection image is projected thereon; and an inspection unit 22 for inspecting the inspection image projected on the part 14 on which an image is projected.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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