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SURFACE MEASUREMENT DEVICE AND METHOD THEREOF
专利权人:
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
发明人:
CHO Chia-Hung,CHUANG Kai-Ping,CHANG Yi-Wei
申请号:
US201615249298
公开号:
US2017059311(A1)
申请日:
2016.08.26
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
A surface measurement device includes a rotating platform, a motion lever, a measuring module and a control module. The rotating platform rotates an object at a rotating speed. The motion lever is above the rotating platform. The measuring module moves to a variety of measuring positions on the motion lever. When the measuring module is at one of the measuring positions, the measuring module measures the heights of a plurality of sampling points on the surface of the object in a sampling frequency. The control module selectively modifies the rotating speed of the rotating platform or the sampling frequency of the measuring module according to the measuring position of the measuring module to make the distance between the sampling points in at least a region of the surface of the object match a sampling rule.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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