Gigler Alexander Michael,Hedler Harry,Pastusiak Remigiusz,Schick Anton
申请号：
US201515566009
公开号：
US2018113074(A1)
申请日:
2015.04.30
申请国别(地区):
美国
年份:
2018
代理人:
摘要：
The present disclosure relates to measuring light emission. The teachings thereof may be embodied in emission-measuring devices. For example, a device may include: a sample region; an illumination unit for irradiating the sample region and a sample positioned therein; and a radiation detector. The illumination unit may include: a radiation source; a first dispersive element arranged downstream, decomposing the radiation into spectral components; a first micromirror field arranged downstream; and a second dispersive element arranged downstream of the first micromirror field. The second dispersive element may unify spectral components selected by the first micromirrror field into a common excitation beam.
