A scan test circuit includes a scan chain formed of a plurality of sub-scan chains, an input distribution circuit, and an output compression circuit. With the use of a bypass circuit, a plurality of sub-scan chains are formed in a compression scan mode by connecting scan cell circuits of a high confidentiality-requiring circuit among a plurality of scan cell circuits included in an internal circuit, and a plurality of sub-scan chains are formed in a non-compression scan mode by bypassing the scan cell circuits of the high confidentiality-requiring circuit.
