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X線エネルギースペクトル測定方法およびX線エネルギースペクトル測定装置およびX線CT装置
专利权人:
株式会社日立製作所
发明人:
高木 寛之,村田 勲
申请号:
JP2014086712
公开号:
JP6133231B2
申请日:
2014.04.18
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device 10. An energy spectrum estimation device 92 normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device 92 then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit 30. The energy spectrum estimation device 92 calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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