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PROCEDE D'IMAGERIE PAR CONTRASTE DE PHASE AUX RAYONS X, FONDE SUR DES RESEAUX DE DIFFRACTION, EN UNE SEULE ETAPE ET N'EXIGEANT QUE DE FAIBLES DOSES
专利权人:
INSTITUTE OF HIGH ENERGY PHYSICS;PAUL SCHERRER INSTITUT
发明人:
ZHU, PEIPING,WU, ZIYU,STAMPANONI, MARCO
申请号:
CA2751442
公开号:
CA2751442C
申请日:
2010.02.03
申请国别(地区):
CA
年份:
2018
代理人:
摘要:
Phase sensitive X-ray imaging methods can provide substantially increasedcontrast over conventional absorptionbased imaging, and therefore new and otherwise inaccessible information. Theuse of gratings as optical elements in hard X-rayphase imaging overcomes some of the problems that have impaired the wider useof phase contrast in X-ray radiography and tomography.So far, to separate the phase information from other contributions detectedwith a grating interferometer, a phase-step-pingapproach has been considered, which implies the acquisition of multipleradiographic projections. Here, an innovative, high-lysensitive X-ray tomographic phase contrast imaging approach is presented basedon grating interferometry, which extracts thephase contrast signal without the need of phase stepping. Compared to theexisting phase step approach, the main advantage ofthis new method dubbed "reverse projection" is the significantly reduceddelivered dose, without degradation of the image quality.The new technique sets the pre-requisites for future fast and low dose phasecontrast imaging methods, fundamental for imagingbiological specimens and in-vivo studies.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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