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REDUCED-PAIN ALLERGY SKIN TEST DEVICE
专利权人:
Ziv Harish
发明人:
Ziv Harish,Isaac Rubinstein,Ehud Arbit,Russ Weinzimmer
申请号:
US12902030
公开号:
US20120089048A1
申请日:
2010.10.11
申请国别(地区):
US
年份:
2012
代理人:
摘要:
An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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