您的位置: 首页 > 农业专利 > 详情页

Reduced-pain allergy skin test device
专利权人:
Ziv Harish
发明人:
Ziv Harish,Isaac Rubinstein,Ehud Arbit,Russ Weinzimmer
申请号:
US14958929
公开号:
USRE046823E1
申请日:
2015.12.03
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充