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Allergy Skin Test Devices with Surrounding Pain-Reduction Structures
专利权人:
Russ Weinzimmer;Ziv Harish
发明人:
Ziv Harish,Russ Weinzimmer
申请号:
US14599799
公开号:
US20160206333A1
申请日:
2015.01.19
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An allergy skin testing device is disclosed that includes at least one central post having at least one sharp probe extending longitudinally from an end of the at least one central post, the at least one sharp probe being for administering an allergen to skin. For each central post, at least three dull probes substantially surround the at least one sharp probe, creating a “pain gate fence”, the at least three dull probes being for activating a pain gate effect affecting nerves of the skin while the at leat one sharp probe administers the allergen to the skin. The at least three dull probes extend further along the central post than the at least one sharp probe, so when all the probes are pressed against the skin using a gripping portion, the plurality of dull probes press into the skin before the at least one sharp probe penetrates the skin.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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