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Allergy Skin Testing Devices with Rigid Annular Pain-Reduction Structures Supported by Respective Compressible Sleeves
专利权人:
Richard Caizza
发明人:
Richard Caizza,Ziv Harish,Russ Weinzimmer
申请号:
US15796104
公开号:
US20180214136A1
申请日:
2017.10.27
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Single and multiple allergy skin testing devices with rigid annular pain-reduction structures supported by respective compressible sleeves. Each rigid annular pain-reduction structure presses against skin before and while at least one corresponding sharp probe presses against the skin surrounded by the rigid annular pain-reduction structure, thereby causing a surrounding pain gate effect to reduce perceived pain due to the at least one sharp probe. Each allergy skin testing device includes: a central post having a sharp portion, a longitudinal portion, and a guide portion a compressible structure having a leading portion, a resilient compressible portion, and a base portion and a rigid annular probe portion having an annular skin-contacting surface. The surrounding pain gate effect is activated when the annular skin-contacting surface is pressed against the skin before and while the one or more sharp probes are pressed against the skin surrounded by the annular skin-contacting surface to administer allergen.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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