PROBLEM TO BE SOLVED: To provide a particle beam irradiation device for achieving highly precise beam irradiation eliminating the influence of hysteresis of a scanning electromagnet.SOLUTION: The particle irradiation device is provided with a magnetic filed sensor 20 for measuring the magnetic field of the scanning electromagnet 3 and an irradiation control device 5 for controlling the emission amount of the charged particle beam 1b which has passed through the scanning electromagnet 3. The irradiation control device 5 obtains the integral value of the dose of the charged particle beam 1b which has passed through a plurality of regions Si, j defined by the magnetic field in the X direction and Y direction measured by the magnetic filed sensor 20 in each region Si, j, and controls the emission amount of the charged particle beam 1b based on the integral value in each region Si, j.COPYRIGHT: (C)2011,JPO&INPIT【課題】走査電磁石のヒステリシスの影響を排除し、高精度なビーム照射を実現する粒子線照射装置を得ること。【解決手段】走査電磁石3の磁場を測定する磁場センサ20と、走査電磁石3を通過した荷電粒子ビーム1bの出射量を制御する照射制御装置5とを備えた。照射制御装置5は、磁場センサ20で測定されるX方向及びY方向の磁場で定義された複数の領域Si,jを通過した荷電粒子ビーム1bの線量の積算値を前記領域Si,j毎に求め、前記領域Si,j毎の積算値に基づいて、荷電粒子ビーム1bの出射量を制御する。【選択図】図1
