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X-RAY INSPECTION METHOD AND X-RAY INSPECTION DEVICE
专利权人:
TOSHIBA CORP;TOSHIBA ELECTRON TUBES & DEVICES CO LTD
发明人:
ABU HIDEO
申请号:
JP20060166182
公开号:
JP2007330530(A)
申请日:
2006.06.15
申请国别(地区):
日本
年份:
2007
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an X-ray inspection device and an X-ray inspection method capable of certainly detecting a soft and small abnormal tissue with a small amount of exposure, in a medical diagnosis field. SOLUTION: A fan-beam-like X-ray is emitted into a photographic subject, a permeation X-ray image which permeates the photographic subject and comes into an X-ray detector 13 is detected by the X-ray detector 13, and the X-ray image is processed and reconstructed as a refraction X-ray image. Thus, an abnormality of a soft tissue or void in the photographic subject that is hardly detected in difference by X-ray photographing by the permeation X-ray image can be obtained as an image output. COPYRIGHT: (C)2008,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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