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TESTS AUTOMATISÉS D'INTÉGRITÉ
专利权人:
MEDTRONIC; INC
发明人:
申请号:
EP09731027.0
公开号:
EP2271403B1
申请日:
2009.01.14
申请国别(地区):
EP
年份:
2016
代理人:
摘要:
Techniques for testing integrity of various elements of implantable medical device systems are described. Some embodiments automatically test the integrity of one or more system elements in response to detecting an event. Examples of events in response to which an integrity test may be performed include the patient being within a target activity state, a symptomatic event experienced by a patient, an external impact on the patient that exceeds a damage threshold, or an indication that the patient is receiving inappropriate therapy. Some embodiments automatically test integrity in response to failure to autonomously detect an event, which may be indicated by input from a patient. An implantable lead carrying electrodes or a therapeutic substance delivery element, such as a catheter, are examples of system elements for which integrity may be tested in some embodiments.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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