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MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT METHOD
专利权人:
KYOCERA Corporation
发明人:
Daisuke HIGUCHI
申请号:
US16317142
公开号:
US20190380598A1
申请日:
2017.06.29
申请国别(地区):
US
年份:
2019
代理人:
摘要:
A measurement apparatus includes an optical emitter, an optical detector, and a controller. The optical emitter emits irradiation light onto a region. The optical detector detects scattered light from the region, the scattered light corresponding to the irradiation light. The controller causes first irradiation light of a first intensity and second irradiation light of a second intensity lower than the first intensity to be emitted from the optical emitter. The controller detects a predetermined signal on the basis of first scattered light detected by the optical detector in accordance with the first irradiation light and second scattered light detected by the optical detector in accordance with the second irradiation light.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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