ARIEL-UNIVERSITY RESEARCH AND DEVELOPMENT COMPANY LTD.
发明人:
BERNSTEIN, Joseph B.
申请号：
WO2016IL50476
公开号：
WO2016178232(A3)
申请日:
2016.05.05
申请国别(地区):
世界知识产权组织国际局
年份:
2016
代理人:
摘要：
A ring oscillator test circuit, includes an odd number of stages, where each stage includes a load and drive transistor connected in series at a common node. The common node of each stage is electrically connected to the drive transistor gate of the following stage, and the common node of the last stage is connected to the drive transistor gate of the first stage. A first voltage input connects to the drains of all the load transistors. A second voltage input connects to the gates of all of the load transistors. A reference voltage input connects to the sources of all of the drive transistors. At least one of the common nodes connects to a test output.
