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蛍光X線分析装置を用いた貴金属製品の分析方法、及び、貴金属製品分析用のコンピュータプログラム
专利权人:
田中貴金属工業株式会社
发明人:
林 義治,堀田 さえ子
申请号:
JP20130160165
公开号:
JP6266914(B2)
申请日:
2013.08.01
申请国别(地区):
日本
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide a method and computer program for analyzing a noble metal product, such as noble-metal and jewelry using a fluorescent X-ray analyzer, capable of efficiently and appropriately determining the grade thereof.SOLUTION: A virtual composition ratio at the time of initial setting or a virtual composition ratio modified last is set to exclude rhodium when rhodium is detected when the fluorescent-X-ray intensity of an object to be analyzed is measured by a fluorescence X-ray analysis analyzing a noble metal product using an FP method for determining the composition ratio of constituent elements of the object to be analyzed by modifying the virtual composition ratio of the object to be analyzed in successive approximation while setting the virtual composition ratio, calculating a theoretical value of the fluorescent-X-ray intensity and comparing the theoretical value and a measured value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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