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Method for accurate sub-pixel localization of markers on X-ray images
专利权人:
David Sebok
发明人:
David Sebok
申请号:
US12626218
公开号:
US09082036B2
申请日:
2009.11.25
申请国别(地区):
US
年份:
2015
代理人:
摘要:
A method and system of determining a sub-pixel point position of a marker point in an image. Embodiments of the invention allow a marker point sub-pixel localization module executable by an electronic processing unit to obtain an image, including a marker point, and to derive both a background corrected marker point profile and a background and baseline corrected marker point profile. Additionally, embodiments of the invention allow defining of a sub-pixel position of the marker point as a center of a peak of the background corrected marker point profile. Thus, embodiments of the invention allow for rapidly detecting and localizing external markers placed on a patient in projection images.
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中国工程科技知识中心
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