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Method and apparatus for millimeter-wave detection of thermal waves for materials evaluation
专利权人:
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY
发明人:
GOPALSAMI, NACHAPPA,RAPTIS, APOSTOLOS C.
申请号:
US19890431363
公开号:
US5020920(A)
申请日:
1989.11.03
申请国别(地区):
美国
年份:
1991
代理人:
摘要:
A method and apparatus for generating thermal waves in a sample and for measuring thermal inhomogeneities at subsurface levels using millimeter-wave radiometry. An intensity modulated heating source is oriented toward a narrow spot on the surface of a material sample and thermal radiation in a narrow volume of material around the spot is monitored using a millimeter-wave radiometer; the radiometer scans the sample point-by-point and a computer stores and displays in-phase and quadrature phase components of thermal radiations for each point on the scan. Alternatively, an intensity modulated heating source is oriented toward a relatively large surface area in a material sample and variations in thermal radiation within the full field of an antenna array are obtained using an aperture synthesis radiometer technique.
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