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ELECTRONIC DEVICE AND STRESS MEASUREMENT METHOD THEREOF
专利权人:
Samsung Electronics Co.; Ltd.
发明人:
Donghyun LEE,Seunghwan SHIN,Junseok OH,Jongmin CHOI,Jinwoo SEO,Seung-Eun LEE
申请号:
US16640926
公开号:
US20200205724A1
申请日:
2018.06.21
申请国别(地区):
US
年份:
2020
代理人:
摘要:
Various embodiments of the present invention relate to an electronic device and a stress measurement method thereof. The electronic device comprises: a memory for storing a first histogram for determining reference information for computing health condition of a user; a biometric sensor; and at least one processor functionally connected to the memory and the biometric sensor, wherein the at least one processor may be configured to acquire biometric information via the biometric sensor, generate a second histogram by analyzing the acquired biometric information, accumulate the second histogram in the first histogram, thereby updating the first histogram, and update the reference information on the basis of the updated first histogram. Other various embodiments are possible.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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