Methods and systems for adjusting NVM cell bias conditions based upon operating temperature to reduce performance degradation

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专利权人:

NXP USA, Inc.

发明人:

Mu, Fuchen,Wang, Yanzhuo

申请号：

EP20130177131

公开号：

EP2690628(B1)

申请日:

2013.07.18

申请国别(地区):

欧洲专利局

年份:

2018

代理人:

摘要：

Methods and systems are disclosed for making temperature-based adjustments to bias conditions for non-volatile memory (NVM) cells to improve performance and product lifetime of NVM systems. System embodiments include integrated NVM systems (102) having an NVM controller (212), a bias voltage generator (150), and an NVM cell array (204). Further, the NVM systems can store temperature-based bias condition information (132) in storage circuitry. The disclosed embodiments select and apply bias conditions for the NVM cells based upon temperature measurements.

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中国工程科技知识中心

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http://www.ckcest.cn/home/