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SYSTEM AND METHOD FOR ANALYZING QUALITY CRITERIA OF A RADIATION SPOT
专利权人:
ELBIT SYSTEMS ELECTRO-OPTICS ELOP LTD.
发明人:
PE'ER Idit
申请号:
US201515326656
公开号:
US2017205498(A1)
申请日:
2015.07.19
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
A system and method for analyzing quality criteria of a radiation spot are provided herein. The system may include: at least one controllable electromagnetic radiation source configured to generate and transmit a radiation beam onto an object, resulting in a radiation spot on said object; at least one radiation sensor configured to sense and obtain radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other; and an analyzer configured to analyze said radiation reflections, and determine a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria. The method may implement the aforementioned logic in a different architecture.
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