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DEVICE FOR MEASURING CHARACTERISTIC PARAMETERS OF A WAVE
专利权人:
RIGAKEN
发明人:
IZQUIERDO, Albert
申请号:
WO2017EP66308
公开号:
WO2018007256(A1)
申请日:
2017.06.30
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
The subject of the present invention is a method for measuring a height (Hi, hi) relating to a wave by a device (10) mounted on a surfboard (4) used by a surfer (3). The method comprises the steps, implemented by the device, of detecting (S2, S5) at least one bottom point (PBi) from which the board (4) begins an ascent phase on the wave (1), of detecting (S3), at least one top point (PHi) from which the board (4) commences a descent phase on the wave (1) in the direction of propagation of the wave (1), and of calculating a height (Hi, hi) relating to the wave (1) by determining the absolute difference between the height of the detected bottom point (PBi) and the height of the detected top point (PHi).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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