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FIN FIELD-EFFECT TRANSISTOR STATIC RANDOM ACCESS MEMORY DEVICES WITH P-CHANNEL METAL-OXIDE-SEMICONDUCTOR PASS GATE TRANSISTORS
专利权人:
Qualcomm Incorporated
发明人:
MOJUMDER, Niladri Narayan,SONG, Stanley Seungchul,WANG, Zhongze,YEAP, Choh Fei
申请号:
EP20150732139
公开号:
EP3178114(A1)
申请日:
2015.06.12
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要:
A complementary metal oxide semiconductor (CMOS) static random access memory (SRAM) cell. A CMOS SRAM cell in accordance with an aspect of the present disclosure includes a bit line and a word line. Such a CMOS SRAM memory cell further includes a CMOS memory cell having at least a first p-channel device comprising a first channel material that differs from a substrate material of the CMOS memory cell, the first channel material having an intrinsic channel mobility greater than the intrinsic channel mobility of the substrate material, the first p-channel device coupling the CMOS memory cell to the bit line and the word line.
来源网站:
中国工程科技知识中心
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