A circuit interrupting device having an auto-monitoring circuit for periodically testing various functions and structures of the device. The auto-monitoring circuit initiates an auto-monitoring routine which, among other things, generates a self-test fault condition and determines whether the detection mechanisms within the device properly detect the self-test fault. A test fault circuit is configured to generate one or more test pulses that cause the self-test fault condition and the test pulses are generated to occur outside of an active region of the fault detection circuit.
